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    GTC-DC 2019: Streaming, Asynchronous, High-Throughput Workflow for Whole Slide Microscopy Analysis

    Tim Blattner, National Institute of Standards and Technology; Michael Majurski, NIST
    We’ll present a panel of experts from government, nonprofits, and business who will discuss their efforts to create opportunities for the next generation of workers. They’ll share examples of their successes across socioeconomic, racial, and ethnic boundaries in reskilling non-technical employees, upskilling employees into data science and IT roles, and preparing engineers and computer scientists for AI and machine learning.

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